IEEE
EDS Kansai Chapter 会員各位
IEEE Electron Devices Society Japan Chapter
Chair 小柳 光正
Vice Chair 木村 紳一郎
*** EDS DL講演会のお知らせ
***
EDS
Japan Chapter主催の下記DL(Distinguished Lecturer)講演会を開催致します。
多くの皆様にご参加頂けますようご案内申し上げます。
【日時】
平成21年3月13日(金)15:00-16:30
【場所】
信州大学 工学部 総合研究棟1階 大会議室
【講演者】Prof.
TAN CHER MING(Nanyang Technological University)
【題目】“Physics
of Electromigration in Today ULSI Interconnection”
■Abstract
Electromigration
has been and will continue be an important reliability issue for ULSI. With the advanced in technology node in
integrated circuit technology, the physics of electromigration has changed, and
electron wind force is no longer the sole driving force, and also the commonly
used Black Equation is shown to be inaccurate. In this talk, the basic physics of
electromigration will be presented, and the impact of electromigration to
circuit performances will be shown.
The changing driving forces in electromigration will also be shown using
both experimental and modeling approach.
The Black’s equation for the prediction of the electromigration
lifetime is revisited, and it is shown to be invalid experimentally. The alternative model to describe the
lifetime of interconnection due to electromigration is presented.
With
this change in the physics of electromigration, the commonly employed
electromigration aware design methodology is challenged and new method that
employed 3D circuit model will be shown.
Prof.
TAN CHER MING graduated from the National University of Singapore with 1st
class honor in 1984. He received
his M.A.Sc and Ph.D in Electrical Engineering from the University of Toronto in
1987 and 1992 respectively. He has
10 years of industrial experiences in electronic industry (both Singapore and
Taiwan) before joining Nanyang Technological University (NTU) as faculty member
in 1996.
【連絡先】遠藤守信研究室 jimu@endomoribu.shinshu-u.ac.jp
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IEEE
EDS Japan Chapter連絡先: Secretary 田中 徹
E-mail: ttanaka@ieee.org
Home
page: http://www.ieee-jp.org/section/tokyo/chapter/ED-15/
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