IEEE SSCS Kansai Chapterでは，下記の日程で技術セミナーを開催致しました．
今回はAsian Solid-State Circuits Conference (A-SSCC)
2019報告会です．
2019年11月のA-SSCC（マカオ，中国）で発表された注目論文を，7名の方からご講演いただきました．
日時 |
2019年12月17日（火）14:00より17:15 | ||
会場 |
京都工芸繊維大学・15号館(COCプラザ棟)1階 N105 ・ Access Map | ||
主催 |
IEEE Solid-State Circuits Society Kansai/Japan Chapter | ||
共催 |
京都工芸繊維大学 |
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講演 |
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14:00-14:05 |
Opening | ||
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14:05-14:30 |
A Si-Backside Protection Circuits Against Physical Security Attacks on Flip-Chip Devices | Takuji Miki | |
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14:30-14:45 |
T/R-Switch Composed of 3 High-Voltage MOSFETs with 12 uW Consumption That Can Perform Per-Channel TX to RX Self-Loopback AC Tests for 3D Ultrasound Imaging with 3072-Channel Beamformer | Shinya Kajiyama | |
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14:45-15:10 |
A Cost Effective Test Screening Method for Resume Standby Embedded SRAM on 110-nm SoC/MCU | Yoshisato Yokoyama | |
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15:10-15:35 |
Privacy-Aware Data-Lifetime Control NAND Flash System for Right to Be Forgotten with In-3D Vertical Cell Processing | Shun Suzuki | |
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15:35-15:55 |
Break | ||
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15:55-16:20 |
33us, 94uJ Optimal Ate Pairing Engine on BN Curve Over 254b Prime Field in 65nm CMOS FDSOI | Makoto Ikeda | |
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16:20-16:45 |
An IoT Sensor Node SoC with Dynamic Power Scheduling for Sustainable Operation in Energy Harvesting Environment | Yuji Yano | |
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16:45-17:10 |
A 28nm Fully Digital Voltage Monitor with 16.5uV/℃ Accuracy and 0.8mV Quantized Error from -40 to 160℃ for ISO26262 ASIL-D Capable MCU
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Toshifumi Uemura | |
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17:10-17:15 |
Closing |
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参加者 |
15名 | ||