IEEE SSCS Kansai Chapter Technial Seminar

IEEE SSCS Kansai Chapterでは，下記の日程で技術セミナーを開催致しました．
今回は，SSCS Distinguished Lecturer (DL)のQualcommのDr.Keith Bowmanをお招きして技術セミナーを 下記の通り開催いたしました．

日時	2019年06月14日（金）16:30より18:00
会場	メルパルク京都4階 研修室2 Access Map
主催	IEEE Solid-State Circuits Society Kansai Chapter
共催	IEEE Solid-State Circuits Society Japan Chapter
講演
	16:30-18:00	講演 　「 Adaptive and Resilient Circuits for Processors 」 　Dr. Keith Bowman (Qualcomm.) abstract Dynamic device, circuit, and system parameter variations degrade processor performance, energy efficiency, and yield across all market segments, ranging from small embedded cores in an Internet of Things (IoT) device to large multicore servers. This lecture introduces the primary variations during the processor operational lifetime, including supply voltage droops, temperature changes, transistor and interconnect aging, radiation-induced soft errors, and workload fluctuations. This presentation then describes the negative impact of these variations on processor logic and memory across a wide range of voltage and clock frequency operating conditions. To mitigate the adverse effects from dynamic variations, this lecture presents adaptive and resilient circuits while highlighting the key design trade-offs and testing implications for product deployment. 　※英語によるご講演
	参加費	無料
	参加者	23人（内、IEEEメンバー14人）
	講演風景
	集合写真