DL講演会のお知らせ
- 日時
- 場所
- 京都大学工学部新2号館3F 335会議室
- 京都市左京区吉田本町
(地図のPDF)
- 講演者
- Professor Juin Liou (University of Central Florida, USA)
- 講演題目
- Advanced electrostatic discharge (ESD) protection for BiCMOS/CMOS
- 講演概要
- Electrostatic discharge (ESD) is a process in which a finite
amount of charge is transferred from one object (i.e., human body)
to the other (i.e., microchip). This process can result in a very high
current passing through the microchip within a very short period
of time, and more than 35% of chip damages can be attributed to
such an event. As such, designing robust on-chip ESD structures
to protect microchips against ESD stress is a high priority in the
semiconductor industry. An overview on the ESD sources, models,
and protection schemes will first be given in this talk. This is
followed by the examples of robust ESD solutions for protecting
data communication transceivers, high voltage IC, gas-sensor
microchips, and low voltage RF IC.
- 参加費
- 連絡先
- 京都大学大学院エネルギー科学研究科 野澤
- Tel : (075)753-4725
- Fax : (075)753-4725
- E-mail address : nozawa(AT)energy.kyoto-u.ac.jp